Failure Analysis of Broken Tempered Glass Window



Labels: failure analysis, failure anaysis of tempered glass, glass expert, nickel sulfide, nickel sulfide contaminant, NiS, NiS particle, root cause failure analysis
READ CONSULTING provides services to industry in the areas of failure analysis, process development and process improvement. Read Consulting is prepared to use its experience and expertise to analyze customers' specific problems.
Labels: failure analysis, failure anaysis of tempered glass, glass expert, nickel sulfide, nickel sulfide contaminant, NiS, NiS particle, root cause failure analysis
Labels: California glass expert, glass expert, nickel sulfide, nickel sulfide particle, NiS, NiS particle, tempered glass
Labels: failure analysis, failure analysis expert, failure analysis expert witness, glass failure analysis expert, manufacturing defect, nickel sulfide, NiS particle
Glass failure analysis expert witness demonstrates that in the case of the spontaneous failure of tempered glass, the tempered glass failure is caused by the NiS particle. The failed glass door was taken apart to reveal the NiS particle. At this point the Wallner lines surrounding the NiS particle were located. The Wallner lines domonstrate that the NiS particle is in the center of the failure origin, and must be the cause of failure. The upper left photograph is a 20X photomicrograph of the NiS particle and its surroundings taken using Nomarski optics. Upper right is the same photomicrograph upon which arrows have been placed to show the crack travel directions as indicated by the Wallner lines. One can see that the NiS particle is at the center of the origin, and is the cause of the failure.
Labels: failure analysis expert, failure analysis expert witness, glass expert, Glass Failure Analysis Expert Witness, NiS particle, tempered glass
Labels: elemental analysis, failure analysis expert, glass expert, nickel sulfide particle, NiS particle, spontaneous glass failure, spontanious glass failure, tempered glass, tempered glass door
Glass expert analyzed a broken tempered glass door. He was able to preserve the origin and perform a failure analysis. The spontaneous glass failure started in the center of the window and was caused by a nickel sulfide particle (NiS particle). This failure mechanism is well known and has been documented by others. In this case, the glass expert spent some time documenting the initial crack growth. The upper left photomicrograph shows two sets of Wallner lines spreading away from the general location of the 100 micron diameter spherical nickel sulfide particle. The photomicrograph on the upper right shows a circular crack arrest line surrounding the NiS particle. This circular artifact identifies the NiS particle (a manufacturing defect) as the cause of the failure. In addition, it also indicates that the crack stopped at least once before the glass went to failure. At first the crack started as a round crack due to the stresses from the nickel sulfide particle. Later the residual stresses in the glass took control. The circular crack opened up and turned into the classic sets of Wallner lines found in root cause failure analysis of tempered glass.
Labels: crack arrest line, glass expert, manufacturing defect, nickel sulfide, nickel sulfide particle, NiS, NiS particle, residual stress, root cause failure analysis, tempered glass